Microscopy & Tomography

Discovering material structures

Through our imaging analysis techniques, we explore the micro- and nanostructure of materials. Our tomographic capabilities even give us a three-dimensional insight into the structure. Thanks to our application-oriented and industry-related research activities, we can draw on commensurate experience. This includes preparative sample preparation and computer-assisted evaluation as well as post-processing.

Contact: Annika Pfaffenberger
Phone: +49 921 55 7503
E-mail: annika.pfaffenberger@uni-bayreuth.de

Max. sample size [cm] cylinder up to 3 diameters (optimum)

Max. resolution [µm/pixel] [mA] 2.3 at 120x magnification

Features
768×560 CCD-Kamera

Software
Skyscan (TomoNT and NRecon): control and acquisition software, ConeBeam reconstruction (generates cross-sectional images of the sample).

NRecon version 1.6.4.1 (Brucker): quantitative analysis of the reconstructed sectional planes, 3-D Creator (generates 3-D images and videos).

Analysis options

Non-destructive, 3-dimensional analysis of materials (polymer, glass, ceramic, metal) down to the sub-micro range. porous structures. Application examples: foam morphologies (cell size distribution, cell diameter, closed-cell, or open-cell structures), characterisation of fillers in composites and compounds (size, shape, and distribution), porosities, inclusions, etc.

Location: University of Bayreuth

Contact: M.Sc. Tobias Standau

Phone: +49 921 55 7440

E-Mail: tobias.standau@uni-bayreuth.de

Electron source tungsten cathode

Accelerating voltage [kV] 0,5 bis 30

Resolution in SE image [nm] 3 at 30 kV, 15 at 1 kV

Magnification range x5 to x300 000

Specimen stage (travel) [mm] X: 80, Y: 40, Z: 6 to 45

Detectors
Secondary and backscatter electron detector

Contact: Annika Pfaffenberger

Phone: +49 921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Resolution [nm] 0.2 (line), 0.29 (point), at 200 kV

High voltage [kV] 120; 160; 200 (variable)

Nominal voltage [eV] 0 – 2500 (step size 0.2 eV)

Cathode thermal LaB6 cathode

Koehler radiation system four lenses

Focus length [mm] 3

Spherical aberration constant cs [mm] 2.2

Chromatic aberration constant cc [mm] 2.2

Astigmatism [µm] <1

Smallest focusing step [nm] 15

Spectrometer type Omega

Isochromatic [eV] Energy resolution (reduced irradiation) ± 0.65

Distribution [µm/eV] 0.8 (energy distribution plane), 0.3 (image plane)

Image recording
Negative film (3,25″ x 4″), Gatan Ultrascan 1000 CCD camera with Gatan GMS image processing

Contact: Annika Pfaffenberger

Phone: +49 921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Resolution [nm] 0.344 (line), 0.5 (point), at 80 kV

High voltage [kV] 50; 80

Nominal voltage [eV] 0 – 2000 (step size 0.5 eV)

Cathode thermal tungsten cathode

Focus length [mm] 2.6

Spherical aberration constant cs [mm] 2.2

Chromatic aberration constant cc [mm] 1.7

astigmatism [µm] <1

smallest focusing step [nm] 15

Spectrometer type Castaing/Ottensmeyer

Isochromatic [eV] Energy resolution (full irradiation) ± 7.5

Isochromatic [eV] Energy resolution (reduced irradiation) ± 1.5 eV

Distribution [µm/eV] 1.8 (energy distribution plane), 0.5 (image plane)

Image recording
Negative film (3.25″ x 4″), Dage SIT low light video camera, SIS Megaview III CCD camera with AnalySIS image processing

Contact: Annika Pfaffenberger

Phone: +49(0)921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Magnification 6,3 to 40 fach

Features
Digital and analogue image processing

Test method
Surface topography, measuring microscope

Contact: Annika Pfaffenberger

Phone: +49 921 55 7503

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Automated microscope with high-resolution Leica DFC450 digital camera and LAS software for image processing.

Objectives: 5x, 10x, 20x, 50x (plus 10x)

Methods: incident light (brightfield, polarisation), transmitted light (brightfield, polarisation)

Motorised high-performance focusing drive with small step size of 10 nm for capturing image stacks in Z-direction

  • Visualisation of samples with high roughness with outstanding image sharpness
  • Quantification of height differences on the sample surface
  • Automatic combination of overlapping images through stitching function

Can be used with a Mettler-Toledo FP82HT hotstage (in combination with a 20x objective, temperature range: RT to 375 °C).

Accuracy of the hotstage: RT to 100 °C ± 0.4 °C
100 to 200 °C ± 0.6 °C
200 to 300 °C ± 0.8 °C

Contact: Annika Pfaffenberger

Phone: +49 921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Magnification 25 to 175 fach

Features
Digital image processing

Contact: Annika Pfaffenberger

Phone: +49 921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Sputter material gold

Contact: Annika Pfaffenberger

Phone: +49 921 55 75 03

E-mail: annika.pfaffenberger@uni-bayreuth.de

Location: University of Bayreuth

Sample size [mm] Ø 25, height 30

Frequency [1/min] 600

Features
Digital and analogue image processing

Methods
Ideal for cutting composites and foams

Contact: M. Sc. Martin Demleitner

Phone: +49 921 55 7476

E-Mail martin.demleitner@uni-bayreuth.de

Location: University of Bayreuth

FURTHER EQUIPMENT AND TECHNOLOGY

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